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    • Home > Manufacturer > Texas Instruments
    Texas Instruments

    Texas Instruments

    - Burr-Brown was acquired by Texas Instruments on June 21, 2000. Burr-Brown was a developer of high-performance analog products. They designed data converters including 24-bit products. This acquisition allowed Texas Instruments to accelerate their data converter product roadmap by several years.
    Datasheet Image Part Number Manufacturers Stock Description View
    CD40117BPWE4 CD40117BPWE4 CD40117BPWE4 Texas Instruments 5000 IC TERMINATOR PROG DUAL 14-TSSOP + -

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    SN74ABT18504PMRG4 SN74ABT18504PMRG4 SN74ABT18504PMRG4 Texas Instruments 5000 IC SCAN TEST DEVICE 20BIT 64LQFP + -

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    CD40117BPWG4 CD40117BPWG4 CD40117BPWG4 Texas Instruments 5000 IC TERMINATOR PROG DUAL 14-TSSOP + -

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    SN74ABT18640DLR SN74ABT18640DLR SN74ABT18640DLR Texas Instruments 5000 IC SCAN TEST DEVICE 18BIT 56SSOP + -

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    CD40117BPWR CD40117BPWR CD40117BPWR Texas Instruments 5000 IC TERMINATOR PROG DUAL 14-TSSOP + -

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    SN74ABT18640DLRG4 SN74ABT18640DLRG4 SN74ABT18640DLRG4 Texas Instruments 5000 IC SCAN TEST DEVICE 18BIT 56SSOP + -

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    CD40117BPWRE4 CD40117BPWRE4 CD40117BPWRE4 Texas Instruments 5000 IC TERMINATOR PROG DUAL 14-TSSOP + -

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    SN74ABT8543DLR SN74ABT8543DLR SN74ABT8543DLR Texas Instruments 5000 IC SCAN TEST DEVICE 28-SSOP + -

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    CD40117BPWRG4 CD40117BPWRG4 CD40117BPWRG4 Texas Instruments 5000 IC TERMINATOR PROG DUAL 14-TSSOP + -

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    SN74ABT8543DWR SN74ABT8543DWR SN74ABT8543DWR Texas Instruments 5000 IC SCAN TEST DEVICE 28-SOIC + -

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    CD4089BPWG4 CD4089BPWG4 CD4089BPWG4 Texas Instruments 5000 IC BINARY RATE MULTIPLR 16-TSSOP + -

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    SN74ABT8543DWRE4 SN74ABT8543DWRE4 SN74ABT8543DWRE4 Texas Instruments 5000 IC SCAN TEST DEVICE 28-SOIC + -

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    CD74ACT283M96G4 CD74ACT283M96G4 CD74ACT283M96G4 Texas Instruments 5000 IC 4BIT BINARY FILL ADDER 16SOIC + -

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    SN74ABT8646DWR SN74ABT8646DWR SN74ABT8646DWR Texas Instruments 5000 IC SCAN TEST DEVICE 28-SOIC + -

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    SN74ABT8543DWRG4 SN74ABT8543DWRG4 SN74ABT8543DWRG4 Texas Instruments 5000 IC SCAN TEST DEVICE 28SOIC + -

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    SN74ABT8646DWRE4 SN74ABT8646DWRE4 SN74ABT8646DWRE4 Texas Instruments 5000 IC SCAN TEST DEVICE 28-SOIC + -

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    SN74ABT8646DWRG4 SN74ABT8646DWRG4 SN74ABT8646DWRG4 Texas Instruments 5000 IC SCAN TEST DEVICE 28SOIC + -

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    SN74ABT8652DLR SN74ABT8652DLR SN74ABT8652DLR Texas Instruments 5000 IC SCAN TEST DEVICE 28-SSOP + -

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    SN74ABT8652DWRG4 SN74ABT8652DWRG4 SN74ABT8652DWRG4 Texas Instruments 5000 IC SCAN TEST DEVICE 28SOIC + -

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    SN74ABT8652DLRG4 SN74ABT8652DLRG4 SN74ABT8652DLRG4 Texas Instruments 5000 IC SCAN TEST DEVICE 28-SSOP + -

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